In this issue:

Issue 83, January 2008

*Hot Topics
*Reliability Basics
*Tool Tips
*Latest Software Updates
*Hot News
*Contribute to HotWire

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Hot Topics

Life Data Analysis with Zero-Time (Out-Of-The-Box) Failures
In many circumstances, it is possible for failures to occur immediately at the beginning of the life of the product. These failures are sometimes referred to as out-of-the-box or short-term failures and might be attributed to problems in manufacturing, insufficient quality control and pre-shipping inspection, poor packaging or shipping damages. The failure times for such units are zero. Zero values can also be found in a variety of other data set types, such as level crossings in customer usage measurement programs (measurement of a number of events) or time in band (measurement of time spent in a given state). This article examines the effect of the zero values on data analysis and presents a warranty data analysis example containing out-of-the-box failures data using Weibull++ 7.

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Reliability Basics
Analyzing Growth Success/Failure and Reliability Data Using the Lloyd Lipow Model
This continues the series of articles, initiated with the Reliability Basics article in Issue 81 of Reliability HotWire, discussing success/failure data in the context of developmental testing reliability growth analysis. In this month's article, we continue the discussion by highlighting the Lloyd Lipow model, available in RGA 6, and show its application to model success/failure data as well as data sets that consist of reliability values at different times or stages.

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Tool Tips
  • How can I use Stress Profiles in ALTA 7 PROs Monte Carlo and SimuMatic utilities?
  • Why dont my results exactly match the ones in the BlockSim and RENO training guides, even when I use a "seed" for the simulation?

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Latest Software Updates
New service releases are now available for Weibull++ (SR 7.5.3) and ALTA (SR 7.5.3). To determine the compile revision of the application on your computer, select About from the Help menu. More Software Downloads...


Application Date Created Version
Weibull++ 7 11/16/07 7.5.3
ALTA 7 11/16/07 7.5.3
Hot News
* Additional Track Added to 2008 ARS, North America - ReliaSoft received so many excellent presenter submissions this year that we needed to add a third track to ARS, North America! The full presentation program, which consists of 39 results-oriented presentations and 6 expert tutorials, is posted on the Web now. The 2008 International Applied Reliability Symposium, North America will be held June 18 - 20, 2008 in Reno, Nevada. More information about the event can be found at
* Recent publications and presentations by ReliaSoft's Dr. Huairui (Harry) Guo - ReliaSoft Corporation is proud to recognize the following accomplishments:
Publication Title: 2007 IEEE International Conference on Industrial Engineering and Engineering Management
Article Title: D-Optimal Reliability Test Design for Two-Stress Accelerated Life Tests
Author(s): Huairui Guo and Rong Pan
For more information, please see:
Publication Title: Journal of the IEST
Article Title: Accelerated Life Test Modeling of Outdoor Optical Products with Time-Varying Multi-Stresses
Author(s): Chung Lam and Huairui Guo
For more information, please see:
Publication Title: 2007 INFORMS Annual Conference
Article Title: Optimal Design of Reliability Tests for Multiple Stresses
Author(s): Rong Pan and Huairui Guo
For more information, please see: 
* 54th Annual Reliability & Maintainability Symposium (RAMS) - ReliaSoft Corporation will be a participant and presenter at RAMS again this winter. The event will be held at the Palace Station Hotel & Casino in Las Vegas, Nevada on January 28-31, 2008. This year's Symposium theme: "Dawn to Dusk - Life Cycle Prescriptions." RAMS participants are exposed to a wide variety of papers, tutorials, and panel discussions that share the insight of industry and government leaders. Our staff of reliability experts will be on hand to provide information and demonstrate the capabilities of ReliaSoft's complete suite of tools, including our Web-based XFRACAS application.  We always look forward to seeing our old friends and making new ones; please be sure to stop by our booth! For more information and an advanced program, see
Upcoming Public Training Event Calendar
January 2008
January 24 - 25, 2008: RS 401(C) Life Data Analysis (Condensed) in Bangalore, India
February 2008
February 4 - 8, 2008: MSMT Foundations in Frankfurt, Germany
February 20 - 22, 2008: RS 560 Introduction to Design for Reliability in Tucson, Arizona
February 25 - 29, 2008: MSMT Foundations in Tucson, Arizona
March 2008
March 10 - 14, 2008: MSMT Foundations in Singapore
March 17 - 19, 2008: RS 522 Advanced System Analysis in Tucson, Arizona
March 20 - 21, 2008: RS 470 FMEA/FMECA in Tucson, Arizona
March 26 - 28, 2008: International Applied Reliability Symposium in Frankfurt, Germany
March 31 - April 2, 2008: RS 521 Advanced QALT in Frankfurt, Germany
Contribute to HotWire
Contributions Welcomed
As always, your feedback and contributions are appreciated. ReliaSoft is able to provide the most user-friendly reliability software packages and support because we listen to our customers. This applies to our newsletters and publications as well. We welcome any suggestions or contributions you may have for Reliability HotWire. If you have a topic or article that you think would be useful to the readers of Reliability HotWire, feel free to contact us.

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