In this issue: Issue 112, June 2010
*Hot Topics
*Reliability Basics
*Tool Tips
*Hot News
*Contribute to HotWire

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Hot Topics
Build Equivalent Single System During Reliability Growth Testing

During reliability growth testing, it is common that multiple systems are tested concurrently. The cumulative test hours and failure information from all the systems under test are used for reliability growth modeling. For this analysis, it is critical to track all the cumulative test hours from all the systems using the same configuration (i.e. with the same "fixes" implemented). When a failure occurs during reliability growth testing, a fix will be implemented not only on the system that has the failure, but also on other systems in the same test. Ideally, all the systems should be stopped and the same fix should be implemented before resuming the test. However, in reality it is rare that the same fixes will be implemented simultaneously on each system. Delays are common and it complicates the calculation for cumulative test hours. In this article, we will illustrate how to correctly get the cumulative test hours for each failure mode and use them to build an equivalent single system (ESS) for reliability growth modeling and prediction using RGA 7.

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Reliability Basics
Degradation Model Selection in Weibull++
Degradation modeling is an effective reliability analysis tool for products with failures caused by degradation. Weibull++ provides several commonly used degradation models including linear, exponential, power, logarithmic, Gompertz and Lloyd-Lipow. If the mechanism of the degradation is known, a mechanism-based model should be used. An example of this would be the light intensity of an LED that degrades exponentially with time and therefore an exponential model is appropriate for the analysis. If the physics of degradation are not clear, a model that provides the best statistical fit to the data can be used. This model usually is referred to as a statistics-based model. In this article, we will explain how to use Weibull++ to select the best degradation model for your data.

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Tool Tips
  • In Xfmea 5/RCM++ 5, is there a quick way to build a phrase set library based on records that have been defined in an existing FMEA?
  • In BlockSim is there a way to turn off the confirmation window when I use the Active Block drop-down list to move from the Block Properties window of one block to another?

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Hot News
* Certified Reliability Professional (CRP) Program - The Certified Reliability Professional program has been designed to distinguish professionals who have gained and successfully demonstrated unquestionable expertise in the field of reliability engineering. To achieve certification, candidates must a) complete a series of training courses focused on important reliability engineering topics, b) successfully apply the learned body of knowledge in the workplace and c) publicly present this expertise via an industry conference or journal. For more information about this certification program, please visit

Recognition of CRP Recipients - The following reliability professionals have recently earned their Certified Reliability Professional Program certification. Each year, at Applied Reliability Symposiums throughout the world, we honor these recipients for their outstanding achievement in reliability engineering.

Name Country CRP Number Issue Date
Erick A L Fialho Araújo  Brazil 15021 June 2009
Rodney Santos Oliveira Brazil 15095 August 2009
Salvador Simões Filho Brazil 15362 August 2009
Elisa Carlucci Italy 15173 November 2009
Andreas Aal Germany 15352 February 2010
Joni Kiiski Finland 15141 April 2010
Patrick Werner Germany 15154 April 2010
Fabiana Pereira Silva Brazil 15312 May 2010
Igor Silva Teixeira de Lima Brazil 15292 May 2010
Miguel Marcelino de Carvalho Neto Brazil 15221 May 2010
Michael Mundt USA 15502 June 2010

Congratulations to all of you for a job well done!

Upcoming Public Training Event Calendar
June 2010
June 14 - 18, 2010: RS 540 Reliability and Maintainability Analysis for Repairable Systems in Kuala Lumpur, Malaysia
June 15 - 17, 2010: International Applied Reliability Symposium in Reno, Nevada
June 21 - 25, 2010: MSMT Foundations in Bologna, Italy
July 2010
July 12 - 16, 2010: RS 540 Reliability and Maintainability Analysis for Repairable Systems in Melbourne, Australia
August 2010
August 9 - 11, 2010: RS 480 RCM Principles and Applications in Chennai, India
August 23 - 27, 2010: RS 540 Reliability and Maintainability Analysis for Repairable Systems in Singapore
August 23 - 27, 2010: MSMT Foundations in San Diego, California
August 31 - September 2, 2010: RS 560 Fundamentals of Design for Reliability in San Diego, California
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