In this issue: Issue 123, May 2011
*Hot Topics
*Reliability Basics
*Tool Tips
*Hot News
*Contribute to HotWire

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Hot Topics
Taguchi Robust Design for Product Improvement: Part II
During the past several decades many methods on experimental design and data analysis for achieving product/process robustness have been proposed. In this article, we will use ReliaSoft’s DOE++ to illustrate the location and dispersion modeling method for doing so. Two models (transfer functions) will be built: one for the location (the mean of the observations) and the other for the dispersion (the standard deviation of the observations). The optimal setting of each control factor will be identified using these two transfer functions. This article provides a complement to Issue 122 of Reliability HotWire where we presented a case study on using the signal-to-noise ratio as the response for the regression model. The optimal setting of each control factor was identified using the transfer function between the control factors and the signal-to-noise ratio.

To read more, see http://www.weibull.com/hotwire/issue123/hottopics123.htm  Read more...

Reliability Basics
The MLE Solution for the Location Parameter of the 2-Parameter Exponential Distribution
In Weibull++, when using the 2-parameter exponential distribution, the software always sets the location parameter, gamma, equal to the first time-to-failure. Is there any theoretical explanation for it? In this article we will explain this special case of the MLE solution for the 2-parameter exponential distribution.

To read more, see http://www.weibull.com/hotwire/issue123/relbasics123.htm  Read more...

Tool Tips
  • How can I install ReliaSoft software without having to provide user input during installation?
  • How can I use the Duty Cycle property in BlockSim?

To read more, see http://www.weibull.com/hotwire/issue123/tooltips123.htm  Read more...

Hot News
* Recently Published - "Designing Reliability Demonstration Tests for One-Shot Systems Under Zero Component Failures" by Huairui Guo (ReliaSoft), Tongdan Jin (State University of Texas) and Adamantios Mettas (ReliaSoft). Published in IEEE Transactions on Reliability, Volume 60, Issue 1, March 2011.
* 2011 ARS North America Coming Up Fast!!! - Next month’s Applied Reliability Symposium will once again provide a forum for industry experts and reliability practitioners to discuss the practical application of reliability principles. Real world challenges and the success stories associated with them will be the primary focus. Don’t miss this rapidly approaching event. Simply visit http://www.ARSymposium.org/register.htm to register now. The Symposium is scheduled for June 7 - 9, 2011 in San Diego, California. Rooms must be reserved by May 16, 2011 to be eligible for the reduced rate of US$159.00 per night (US$147.00 for government employees).
   
Upcoming Public Training Event Calendar
May 2011
May 17 - 19, 2011: RS 588 DOE: Experiment Design and Analysis in Tucson, Arizona
May 23 - 27, 2011: RS 540 Reliability and Maintainability Analysis for Repairable Systems in Jakarta, Indonesia
May 24 - 26, 2011: RS 480 RCM Principles and Applications in Zurich, Switzerland
June 2011
June 7 - 9, 2011: International Applied Reliability Symposium in San Diego, California
June 13 - 14, 2011: RS 401(C) Reliability and Life Data Analysis (Condensed) in Rayong, Thailand
June 13 - 17, 2011: MSMT Foundations in Rome, Italy
June 22 - 24, 2011: RS 521 Advanced Accelerated Life Testing Analysis in Bangalore, India
July 2011
July 4 - 8, 2011: RS 540 Reliability and Maintainability Analysis for Repairable Systems in Kuala Lumpur, Malaysia
July 13 - 15, 2011: RS 480 RCM Principles and Applications in Chennai, India
July 18 - 22, 2011: RS 540 Reliability and Maintainability Analysis for Repairable Systems in Melbourne, Australia
Contribute to HotWire
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