| In this issue: |
Issue 112,
June 2010 |
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Hot Topics |
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Build Equivalent Single System During Reliability Growth Testing
During reliability growth testing, it is common that multiple systems are tested concurrently. The cumulative test hours and failure information from all the systems under test are used for reliability growth modeling. For this analysis, it is critical to track all the cumulative test hours from all the systems using the same configuration (i.e. with the same
"fixes" implemented). When a failure occurs during reliability growth testing, a fix will be implemented not only on the system that has the failure, but also on other systems in the same test. Ideally, all the systems should be stopped and the same fix should be implemented before resuming the test. However, in reality it is rare that the same fixes will be implemented simultaneously on each system. Delays are common and it complicates the calculation for cumulative test hours. In this article, we will illustrate how to correctly get the cumulative test hours for each failure mode and use them to build an equivalent single system (ESS) for reliability growth modeling and prediction using
RGA 7.
To read more, see
http://www.weibull.com/hotwire/issue112/hottopics112.htm

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Reliability Basics |
Degradation Model Selection in Weibull++
Degradation modeling is an effective reliability analysis tool for products with failures caused by degradation.
Weibull++ provides several commonly used degradation models including linear, exponential, power, logarithmic, Gompertz and Lloyd-Lipow. If the mechanism of the degradation is known, a mechanism-based model should be used. An example of this would be the light intensity of an LED that degrades exponentially with time and therefore an exponential model is appropriate for the analysis. If the physics of degradation are not clear, a model that provides the best statistical fit to the data can be used. This model usually is referred to as a statistics-based model. In this article, we will explain how to use Weibull++ to select the best degradation model for your data.
To read more, see
http://www.weibull.com/hotwire/issue112/relbasics112.htm
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Tool Tips |
- In Xfmea 5/RCM++ 5, is there a quick way to build a phrase set library based on records that have been defined in an existing FMEA?
- In
BlockSim
is there a way to turn off the confirmation window when I use the Active Block drop-down list to move from the Block Properties window of one block to another?
To read more, see
http://www.weibull.com/hotwire/issue112/tooltips112.htm

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Hot News |
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Certified Reliability Professional (CRP) Program
- The Certified Reliability Professional program has been designed to distinguish
professionals who have gained and successfully
demonstrated unquestionable expertise in the field of
reliability engineering. To achieve certification,
candidates must a) complete a series of training courses
focused on important reliability engineering topics,
b) successfully apply the learned body of knowledge in the
workplace and c) publicly present this expertise via an
industry conference or journal. For more
information about this certification program, please
visit
http://www.ReliabilityProfessional.org. |
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Recognition of CRP
Recipients
- The following reliability professionals have recently earned their Certified Reliability Professional Program certification. Each year, at
Applied Reliability Symposiums throughout the world, we honor these recipients for their outstanding achievement in reliability engineering.
|
Name |
Country |
CRP Number |
Issue Date |
|
Erick A L Fialho
Araújo |
Brazil |
15021 |
June 2009 |
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Rodney Santos
Oliveira |
Brazil |
15095 |
August 2009 |
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Salvador Simões
Filho |
Brazil |
15362 |
August 2009 |
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Elisa Carlucci
|
Italy |
15173 |
November 2009 |
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Andreas Aal |
Germany |
15352 |
February 2010 |
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Joni Kiiski |
Finland |
15141 |
April 2010 |
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Patrick Werner |
Germany |
15154 |
April 2010 |
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Fabiana Pereira
Silva |
Brazil |
15312 |
May 2010 |
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Igor Silva Teixeira
de Lima |
Brazil |
15292 |
May 2010 |
|
Miguel Marcelino de
Carvalho Neto |
Brazil |
15221 |
May 2010 |
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Michael Mundt |
USA |
15502 |
June 2010 |
Congratulations to all of you
for a job well done! |
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Upcoming
Public Training Event Calendar |
|
June 2010 |
|
June 14 - 18, 2010:
RS 540 Reliability and
Maintainability Analysis for
Repairable Systems
in
Kuala Lumpur, Malaysia |
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June 15 - 17, 2010:
International Applied
Reliability Symposium
in
Reno, Nevada |
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June 21 - 25, 2010:
MSMT Foundations
in
Bologna, Italy |
|
July
2010 |
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July 12 - 16, 2010:
RS 540 Reliability and
Maintainability Analysis for
Repairable Systems
in
Melbourne, Australia |
|
August
2010 |
|
August 9 - 11, 2010:
RS 480 RCM Principles and Applications
in
Chennai, India |
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August 23 - 27, 2010:
RS 540 Reliability and Maintainability Analysis for Repairable Systems
in
Singapore |
|
August 23 - 27, 2010:
MSMT Foundations
in
San Diego, California |
|
August 31 - September 2, 2010:
RS 560 Fundamentals of Design for Reliability
in
San Diego, California |
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